Conference Schedule and Speakers

Friday, February 17^th

Registration and Continental Breakfast

7:45-8:30

Welcome Session

8:30-8:45 Introduction and Overview

Susan Embretson and James Roberts,

Georgia Institute of Technology

Session I. Psychometric Models and Approaches to Measure Qualitative

Differences Between Individuals

8:45-9:25 Identifying Latent Class of Examinees for Whom Test

Scores Differ Qualitatively

Matthias von Davier

Center for Global Assessment, ETS

9:25-10:05 Mixtures of Unfolding Item Response Theory Models for

Attitude Measurement

.

James Roberts

Georgia Institute of Technology

Discussion

10:05-10:20 Chan Dayton

University of Maryland

Break

10:20-10:40

Session II. Models for Cognitive Diagnosis and Processing

10:40-11:20 The Fusion Model and Arpeggio System for

Cognitive Skills Diagnosis

Louis Roussos

University of Illinois at Urbana-Champaign

11:20-12:00 Cognitive Psychometrics and Multinomial Processing

Tree (MPT) Models

William Batchelder

University of California, Irvine

12:00-12:15 Discussion

Brian Habing

University of SouthCarolina

Lunch

12:15-1:45

Session III. Psychometric Models for Interactive Item Generation During Testing

1:45-2:25 On-the Fly Testing? The Feasibility of an Item

Model Approach for the GRE

Isaac Bejar

Educational Testing Service

2:25-3:05 A Structural Model Approach to Generating and

Calibrating Intelligence Test Items

Susan Embretson

Georgia Institute of Technology

3:05-3:35 Discussion

Seock-Ho Kim

University of Georgia

Break

3:35-4:00

Session IV. Poster Session and Reception

4:00-5:30

Saturday, February 18^th

Registration and Continental Breakfast

8:15-9:00

Session V. Measurement from Naturalistic Observations

9:00-9:40 Measuring Personal Interactions with IRT Random

Effects Models

Rianne Janssen

University of Leuven, Belgium

9:40-10:20 Applications of Structural IRT Models to

Measuring Feelings and Attitudes

Paul DeBoeck

University of Leuven, Belgium

10:20-10:35 Discussion

Lawrence James

Georgia Institute of Technology

Break

10:35-10:55

Session VI. Model-Based Approaches to Isolating Entangled Constructs,

10:55-11:35 Separating Primary Traits from General Intelligence

Jan-Eric Gustafsson

University of Gotesberg, Sweden

11:35-12:15 Overly-correlated Items in Personality and Attitude Surveys

Removing Inflated Internal Consistency With Testlet

Modeling Approaches

David Thissen

University of North Carolina

12:15-12:30 Discussion

Chris Hertzog

Georgia Institute of Technology

Lunch

12:30-2:00

Session VII. Model-Based Approaches to Measuring Psychopathology

2:00-2:40 Measuring Psychopathology with Non-Standard IRT Models:

Lessons from the MMPI

Niels Waller

University of Minnesota

2:40-3:20 Using EM and MCMC Algorithms to Study Responses in

Experiments with Schizophrenic and Normal Patients

Donald Rubin

Harvard University

3:20-3:35 Discussion

Edward Ip

Wake Forest University

Break

3:35-3:55

Session VIII. Software Demonstration

3:55-5:00