Invited Speakers

Louis Roussos, University of Illinois
     Model-Based Skills Diagnosis in Educational and Psychological Settings

Mattias von Davier, ETS
     Identifying Latent Classes of Examinees for Whom Test Scores Differ

Isaac Bejar, ETS
     Recent Developments in Automatic Item Generation

Susan Embretson, Georgia Tech
     A Structural Model Approach to Generating and Calibrating Ability Items

Niels Waller, University of Minnesota
     Model-Based Approaches to Measuring Psychopathology

Jan- Eric Gustafsson, University of Gotesberg, Sweden
     Unidimensionality, Homogeneity and Interpretability of Psychological Instruments

Paul DeBoeck, University of Leuven, Belgium
     Double Structure and Change-Point Models for Measuring Feelings and Attitudes

David Thissen, University of North Carolina
     Using Item Response Theory to Disentangle Constructs at Different Levels of Generality

James Roberts, Georgia Tech
     Alternative Mixtures of the Generalized Graded Unfolding Model and Application to Attitude       Measurement

Rianne Janssen, University of Leuven, Belgium

     Development of a Random Effects Version of the Linear Logistic Test Model: Implications for Naturalistic Observation      

Donald Rubin, Harvard University

     Using EM and MCMC Algorithms to Study Responses in Experiments with Schizophrenic and Normal Patients